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 Associated
Research is committed to innovating and developing the most
advanced technology in the electrical safety compliance testing
industry. This can be seen in the fact that we hold more technology
patents than anyone else in the industry. An advanced and reliable
product is one of the many reasons why we have led the industry
for over 65 years. At AR, you can rest assured that you have
the latest technology available. The proof is in our patents.
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| U.S. Patent No. |
Description |
| 7,330,342 |
This patent covers the relay protection circuit breaker system in our Line Leakage testers that provides protection to relays which are required to operate at high voltage and line voltage levels. |
| 7,026,822 |
This patent covers the configurable nature of Associated Research’s SC6540 modular scanning matrix allowing for a variety of scanning solutions. |
| 6,744,259 |
This patent covers the VERI-CHEK® feature used in Associated Research Electrical Safety testers allowing quick and easy validation of a testers functionality. |
| 6,549,385 |
This patent covers the SmartGFI® circuit used in Associated
Research high voltage safety testers to protect operators from
exposure to high voltage. |
| 6,538,420 |
This patent covers the interconnection of
a run test system to an electrical safety tester including the
built-in high voltage switching circuit. |
| 6,515,484 |
This patent covers an advanced user interface that includes
features such as Pause/Prompt, CAL-ALERT®, Security Access Functions
and a flexible menu structure that allows tests to be added
through plug in modules. |
| 6,054,865. |
This patent covers multi-function safety
compliance analyzers that are capable of performing AC and DC
Dielectric tests as well as Insulation Resistance and either
Ground Continuity or Ground Bond with a single instrument. |
| 6,011,398 |
This patent covers the multiple circuits used in our line
leakage testers to simulate the impedance of the human body.
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| 5,828,222 |
This patent covers the exclusive RAMP-HI®
circuit as used in DC Hipot testing to allow a higher level
of current draw during the ramping to allow for more rapid charging
of the device under test. |
| 5,936,419 |
This patent covers the exclusive CHARGE-LO® circuit as used
in DC Hipot testing to detect charging current as an indication
that the device under test is properly connected. |
| 5,548,501 |
This patent covers the high voltage auto
discharge circuit that is used in all Associated Research DC
dielectric withstand testers. |
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